SD Card DAC AVG B Scan Mini Ultrasonic Flaw Detector Dual LEMO-00 C5 Interface
Brief introduction
FD540mini ultrasonic flaw detector is a new type of ultrasonic testing product launched by our company, widely used in industries such as boilers, pressure vessels, power, petroleum, chemical, offshore oil, pipelines, shipbuilding, automobiles, mechanical manufacturing, metallurgy, metal processing, steel structures, railway transportation, nuclear power, universities, etc. It can conveniently detect, locate, evaluate and diagnose various internal defects (cracks, looseness, pores, inclusions, etc.) in workpieces . This digital ultrasonic flaw detector has a compact structure, stable waveform, strong endurance, high sensitivity, fast response, and a maximum repetitive emission frequency of up to 10000Hz. It is an extremely portable ultrasonic flaw detection product.
Technical parameters
| Detection range | 10m(Longitudinal wave carbon steel) (Metrological performance requirements: ≥3500mm) |
| Pulse mode | Sharp pulse, square wave, dual-square wave |
| Pulse voltage | 25V～300V adjustable Stepping 25V |
| Pulse width | 0ns～500ns continuously adjustable,10ns pace |
| Damping | strong and weak adjustable |
| Pulse repetition frequency | Automatic or manual, continuously adjustable from 100Hz to 1000Hz, with a pace of 10Hz |
| Gain | 120dB, pace 0.1dB, 1dB, 10dB |
| Bandwidth | 0.1MHz～20MHz |
| Wave filter | 1M~5M |
| Display screen | 5.0-inch LCD, the effective display size is 108mm long and 64mm wide |
| Resolution | 800×480 |
| Instrument interface | Dual LEMO-00 C5 |
| Alarm | Gate A, B alarm |
| Output interface | Type-c USB |
| Detection mode | Full wave, positive half wave, negative half wave, RF |
| Gate | Independent A,B |
| Measurement mode | Peak, wave side |
| Memory | SD card 8G,optional 16G/32G/64G |
| Save content | Single frame, multi-frame continuous recording (≤200 frames) |
| Quantitative mode | DAC curve,AVG(DGS) curve |
| Auxiliary functions | Support touch, virtual keyboard, PD fast charging ,automatic gain, peak memory, freeze |
| Flaw detection standards | AWS D1.1/D1.5,NB/T 47013,GB/T 29712,GB/T 11345 |
| Size and weight | 183mm×113mm×45mm 780g,battery included |
| Battery | 12 hours |
| Unit | Metric,imperial |
| Operating temperature | -10℃～55℃ |
| Charger | “Genaral”AC(100～240V, 50～60Hz) |
| Resolution | 36dB (Metrological performance requirements:≥26dB) |
| Dynamic range | 40dB (Metrological performance requirements:≥26dB) |
| Sensitivity margin | 60dB (Metrological performance requirements:≥42dB) |
| Vertical linearity | 2.8% (Metrological performance requirements:≤6%) |
| Horizontal linearity | 0.6% (Metrological performance requirements:≤2%) |
| Language | Chinese/English |
Features
1: The body is lightweight and suitable for one-handed operation.
2: PD65W fast charge + 12 hours long battery life.
3: 5.0-inch IPS high-definition display with a brand new UI interface.
4: Support full-screen touch, quick gesture operation, virtual keyboard,
easy to use
5: With DAC, AVG, automatic gain, peak memory, color half-span, B-scan
and other professional functions.
6: English menu, data export to 8G SD card, online upgrade, screen capture and many other practical functions.
Standard configuration
| Serial Number | name | number |
| 1 | Host FD540mini | 1 |
| 2 | Probe (high-precision straight probe, angle probe) | 2 |
| 3 | Probe line | 2 |
| 4 | Charger | 1 |
| 5 | Power line | 1 |
| 6 | Instruction manual | 1 |
| 7 | Certificate of conformity | 1 |
| 8 | Warranty card | 1 |
Optional accessories
Portable power pack
SD card 16G/32G/64G
IIW V1 V2 DAC ASME blocks
Product Tags:
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SD Card DAC AVG B Scan Ut Flaw Detector Mini Dual LEMO-00 C5 Interface Images
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